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Measurment & Sensor Professional Group

home > Application > Nano thin film

Application

Nano thin film

Large area nano thin film thickness & Refraction measurement system Korea Research Institute of Standards and Science & MSOTEK

Line Resolution : more than 10k point
→ Linear measurement available
Measurement speed : > 150P / sec
→ Measured point can be extended
High speed measurement available
→ Whole lot inspection available
Contribute to the improvement of OLED yield rate
Line Resolution : more than 10k point
→ Linear measurement available
Measurement speed : > 150P / sec
→ Measured point can be extended
High speed measurement available
→ Whole lot inspection available
Contribute to the improvement of OLED yield rate

제품 설명

X-Y Stage → substitute with X-axis transfer
Precision : < 1Å
Point measuring method → Line measuring method
LCD : 1500 points / min

Real-time whole lot inspection available, improved process yield